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Title:Analiza površine vlaken z mikroskopijo atomskih sil (AFM)
Authors:ID Tušek, Lidija (Author)
ID Strnad, Simona (Author)
ID Stana-Kleinschek, Karin (Author)
ID Ribitsch, Volker (Author)
ID Werner, Carsten (Author)
Files:.pdf Tekstilec_2000_Tusek_et_al._Analiza_povrsine_vlaken_z_mikroskopijo_atomskih_sil_(AFM).pdf (902,74 KB)
MD5: DD7DB7460550BFB165A79272FE791A97
PID: 20.500.12556/dkum/09673889-24a9-4055-aaa4-8b80a3274d17
 
URL http://www.tekstilec.si/wp-content/uploads/2000/09/Investigation-of-Fibre-Surfaces-Using-Atomic-Force-Microscopy-AFM.pdf
 
Language:Slovenian
Work type:Scientific work
Typology:1.01 - Original Scientific Article
Organization:FS - Faculty of Mechanical Engineering
Abstract:Mikroskopija atomskih sil (ang.: atomic force microscopy AFM) je ena od oblik mikroskopij, ki omogoča opazovanje neprevodnih površin v nanometrskem merilu. Razvila sta jo Nobelova nagrajenca s področja fizike, Binnig in Roher [5, 6]. Od izuma leta 1986 pa do danes je mikroskop atomskih sil postal zelo pomemben inštrument v laboratorijih za fiziko trdnih snovi, kemijskih, polimernih in bioloških laboratorijih, pojavlja pa se tudi že v industriji. Izredno uporaben je na področju tekstilstva, čeprav njegovih zmožnosti na tem področju do sedaj še niso intenzivneje raziskali. Struktura vlaken je zapletena. Večinoma je morfologija površine drugačna od tiste v notranjosti. Oblika površine vlaken vpliva na procese, ki se odvijajo na mejnih površinah. Zato je toliko bolj pomembno uvajanje novih metod na področje analize površinskih lastnosti vlaken. Mikroskop atomskih sil AFM nudi informacije o fibrilni strukturi vlaken, poleg tridimenzionalne analize površine vlaken omogoča tudi merjenje medmolekulskih in medatomskih sil velikostnega reda nekaj nN. V primerjavi z elektronskim mikroskopom je priprava vzorca mnogo enostavnejša. V prispevku je opisan princip delovanja AFM in predstavljeni rezultati analize PAG filamenta. Na površini PA6 monofilamenta je vidna fibrilna struktura. Najmanjši fibrili, ki jih je mogoče razločiti, imajo premer le nekaj 10 nm. Združujejo se v večje fibrilne snope, ki v najširših predelih merijo 1 do 2 μm. Praznine in vdolbine na površini so različno velike (30-200 nm) in so okrogle ali ovalne oblike, usmerjene v smeri osi vlakna. Površina filamenta je v smeri osi vlakna manj razbrazdana; višinska razlika med najnižjimi in najvišjimi področji znaša v prečni smeri do 70 nm, v vzdolžni smeri pa do 30 nm.
Keywords:mikroskop atomskih sil, obdelava slik, površinska analiza, struktura, vlakna, PA6
Publication status:Published
Publication version:Version of Record
Year of publishing:2000
Number of pages:str. 343-348
Numbering:Letn. 43, št. 9/10
PID:20.500.12556/DKUM-67764 New window
ISSN:0351-3386
UDC:677.494.675:677.014.572
ISSN on article:0351-3386
COBISS.SI-ID:5885718 New window
NUK URN:URN:SI:UM:DK:5AMI0NGP
Publication date in DKUM:30.08.2017
Views:2697
Downloads:124
Metadata:XML DC-XML DC-RDF
Categories:Misc.
:
TUŠEK, Lidija, STRNAD, Simona, STANA-KLEINSCHEK, Karin, RIBITSCH, Volker and WERNER, Carsten, 2000, Analiza površine vlaken z mikroskopijo atomskih sil (AFM). Tekstilec : glasilo slovenskih tekstilcev [online]. 2000. Vol. 43, no. 9/10, p. 343–348. [Accessed 29 March 2025]. Retrieved from: https://dk.um.si/IzpisGradiva.php?lang=eng&id=67764
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Record is a part of a journal

Title:Tekstilec : glasilo slovenskih tekstilcev
Shortened title:Tekstilec
Publisher:Zveza inženirjev in tehnikov tekstilcev, Splošno združenje tekstilne industrije, Zveza inženirjev in tehnikov tekstilcev, Splošno združenje tekstilne industrije, Društvo inženirjev in tehnikov tekstilcev, Univerza v Ljubljani, Naravoslovnotehniška fakulteta, Oddelek za tekstilstvo, Založba Univerze v Ljubljani
ISSN:0351-3386
COBISS.SI-ID:763396 New window

Licences

License:CC BY 4.0, Creative Commons Attribution 4.0 International
Link:http://creativecommons.org/licenses/by/4.0/
Description:This is the standard Creative Commons license that gives others maximum freedom to do what they want with the work as long as they credit the author.
Licensing start date:30.08.2017

Secondary language

Language:English
Title:Investigation of fibre surfaces using Atomic Force Microscopy (AFM)
Abstract:Atomic force microscopy (AFM) is one of the most modem types of microscopy enabling nanoscale imaging of both conducting and insulating surfaces. It was developed by the Nobel Prize winners in physics, Binning and Roher. Since its invention in 1986 the atomic force microscope has become useful in industry and as a very important laboratory instrument in different fields of research such as physics, chemistry, polymers and biology. This method can also be applied in textile research although the researchers working in this field are few. The structure of fibres is very complex. In most cases the morphology of the fibre surface differs from the morphology of the core. The characteristics of the fibre surface influence the processes at the interfaces which makes any surface analysis of the fibres extremely important, and the introduction of new methods valuable. AFM gives a three-dimensional nanoscale image of the surface thus revealing additional information about the fibrillar structure of the fibres. It can also be used for intermolecular and intercolloidal force measurements sensing forces even smaller than 1 nN. A sample preparation prior to imaging is much simpler compared to electron microscopy. In this paper the basic AFM operation is discussed and the topography of PA6 filament is analysed using AFM. The fibrillar structure can be seen at the fibre surface. The smallest detectable fibrils are in the range of about 10 nm in width. They are congregated in bigger fibril bundles having up to 1-2 μm in diameter. Cavities and niches vary in width (30-200 nm) and shape (round or oblong). They are oriented in the direction of the fibre. The surface of the filament is less furrowed in the direction of the fibre; the difference in height between the highest and the lowest regions alongside is only up to 30 nm and transverse up to 70 nm.
Keywords:atomic force microscopy, image processing, surface analysis, structure, fibres, PA6


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