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DKUM
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Title:
Uporaba mikroposnetkov z odbitimi elektroni pri identifikaciji faz
Authors:
ID
Zupanič, Franc
(Author)
Files:
http://www.dlib.si/details/URN:NBN:SI:doc-IO9DQFI7
Language:
Slovenian
Work type:
Not categorized
Typology:
1.01 - Original Scientific Article
Organization:
FS - Faculty of Mechanical Engineering
Keywords:
odbiti elektroni
,
koeficient povratnega sipanja elektronov
,
vrstična elektronska mikroskopija
,
SEM
,
karakterizacija
Publisher:
Društvo za vakuumsko tehniko Slovenije
Year of publishing:
2011
Number of pages:
str. 4-7
Numbering:
Letn. 31, št. 1
PID:
20.500.12556/DKUM-52287
UDC:
620.187.2
ISSN on article:
0351-9716
COBISS.SI-ID:
14841622
NUK URN:
URN:SI:UM:DK:WNCM9AVC
Publication date in DKUM:
10.07.2015
Views:
1866
Downloads:
67
Metadata:
Categories:
Misc.
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Vancouver
:
ZUPANIČ, Franc, 2011, Uporaba mikroposnetkov z odbitimi elektroni pri identifikaciji faz.
Vakuumist
[online]. 2011. Vol. 31, no. 1, p. 4–7. [Accessed 30 March 2025]. Retrieved from: http://www.dlib.si/details/URN:NBN:SI:doc-IO9DQFI7
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Record is a part of a journal
Title:
Vakuumist
Shortened title:
Vakuumist
Publisher:
Društvo za vakuumsko tehniko Slovenije
ISSN:
0351-9716
COBISS.SI-ID:
16059650
Secondary language
Language:
English
Title:
Application of backstattered-electron micrographs for phase identification
Keywords:
backscattered electrons
,
backscattering coefficient
,
scanning electron microscopy
,
SEM
,
characterization
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