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Title:
Elektronska vrstična mikroskopija pri povišanem tlaku (ESEM)
Authors:
ID
Bončina, Tonica
(Author)
Files:
http://www.dlib.si/details/URN:NBN:SI:doc-VZZABVAI
Language:
Slovenian
Work type:
Not categorized
Typology:
1.04 - Professional Article
Organization:
FS - Faculty of Mechanical Engineering
Keywords:
okoljski vrstični elektronski mikroskop
,
sekundarni okoljski elektroni
,
plinski detektor za sekundarne ione
,
reducirna zaslonka
Publisher:
Društvo za vakuumsko tehniko Slovenije
Year of publishing:
2011
Number of pages:
str. 14-19
Numbering:
Letn. 31, št. 2
PID:
20.500.12556/DKUM-52240
UDC:
620.187.2
ISSN on article:
0351-9716
COBISS.SI-ID:
15158294
NUK URN:
URN:SI:UM:DK:GFAYWXT5
Publication date in DKUM:
10.07.2015
Views:
2430
Downloads:
92
Metadata:
Categories:
Misc.
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:
BONČINA, Tonica, 2011, Elektronska vrstična mikroskopija pri povišanem tlaku (ESEM).
Vakuumist
[online]. 2011. Vol. 31, no. 2, p. 14–19. [Accessed 30 March 2025]. Retrieved from: http://www.dlib.si/details/URN:NBN:SI:doc-VZZABVAI
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Record is a part of a journal
Title:
Vakuumist
Shortened title:
Vakuumist
Publisher:
Društvo za vakuumsko tehniko Slovenije
ISSN:
0351-9716
COBISS.SI-ID:
16059650
Secondary language
Language:
English
Title:
The environmental scanning electron microscopy (ESEM)
Keywords:
environmental scanning electron microscopy
,
secondary environmental electrons
,
gaseous detector for secondary electrons
,
pressure-limiting-aperture
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