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Title:
UPORABA AFM SONDE ZA POTREBE NANOROBOTIKE
Authors:
ID
Bratuša, Marko
(Author)
ID
Šafarič, Riko
(Mentor)
More about this mentor...
Files:
UNI_Bratusa_Marko_2011.pdf
(2,59 MB)
MD5: 6E0212DF0A11DD3C087DAFA0B01D5FA0
PID:
20.500.12556/dkum/a1172b16-cb5b-48df-9f8e-da096651b3a4
Language:
Slovenian
Work type:
Bachelor thesis/paper
Organization:
FERI - Faculty of Electrical Engineering and Computer Science
Abstract:
Na področju nanorobotike se za potrebe mikroskopije vse bolj pogosto uporablja AFM metoda. To je metoda mikroskopije, kjer uporabljamo fizikalni efekt Van der Waals-ove sile. AFM nam v navezi z različnimi vrstami sond omogoča izris slike, izris topografije in meritve 3D objekta v nanomerilu. Ena izmed sond, ki se uporablja za to vrsto mikroskopije, je Akiyamo sonda. Slednja je sestavljena iz nihajnih vilic in tipala ter deluje po principu razlike v frekvenci nihanja tipala in zaznavanju sil med sondo in merjenim vzorcem.
Keywords:
nanorobotika
,
AFM metode
,
Akiyamo sonda
Place of publishing:
Maribor
Publisher:
[M. Bratuša]
Year of publishing:
2011
PID:
20.500.12556/DKUM-20391
UDC:
007.52(043.2)
COBISS.SI-ID:
15583510
NUK URN:
URN:SI:UM:DK:75J9HWO5
Publication date in DKUM:
23.09.2011
Views:
1807
Downloads:
112
Metadata:
Categories:
KTFMB - FERI
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:
BRATUŠA, Marko, 2011,
UPORABA AFM SONDE ZA POTREBE NANOROBOTIKE
[online]. Bachelor’s thesis. Maribor : M. Bratuša. [Accessed 3 April 2025]. Retrieved from: https://dk.um.si/IzpisGradiva.php?lang=eng&id=20391
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Secondary language
Language:
English
Title:
USE OF AFM PROBE FOR NANOROBOTICS
Abstract:
It is often used an AFM method for purposes of microscop at the field of nanorobotics. This is a method of microscopy that uses so called Van der Waals force. AFM with multiple kinds of probes enables us to draw a picture, to draw topography and measurement of 3D objects in nanoscale. One of the probes that is used for this kind of microscopy is named an Akiyama probe. It's made out of tuning forks and a tip and works at the principle of difference in frequency of swinging tip and perception force between probe and measured sample.
Keywords:
nanorobotics
,
AFM methodes
,
Akiyamo probe
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