Iskanje po katalogu digitalne knjižnice

Opis: Gallium nitride (GaN) technology has emerged as a transformative solution in the semiconductor industry due to its exceptional performance in highpower and high-frequency applications. With its inherent radiation resilience, GaN is particularly suited for environments such as space electronics and nuclear instrumentation. While static parameter testing under radiation has been extensively studied, dynamic parameter degradation—including propagation delays, rise/fall times, and efficiency losses—remains underexplored. These dynamic characteristics are useful for applications requiring precise timing, signal integrity, and rapid response, such as satellite communication and nuclear systems. This study evaluates the radiation resilience of three commercially available GaN transistors during a 100-krad (Si) Co-60 gamma irradiation campaign, with a focus on both static and dynamic parameters. Static parameters, such as threshold voltage and ON-state resistance, exhibited minimal degradation, while a larger change was observed in gate current. In contrast, dynamic parameters revealed smaller changes, including faster propagation delays and reduced efficiency, with variability observed across device types. The findings support a device-specific co-design of transistors and driver electronics for radiation-tolerant power stages
Ključne besede: Co-60 gamma, drain current, gallium nitride, GaN, gamma irradiation, gate current, in situ measurements, propagation delay, rise and fall times, voltage threshold
Objavljeno v DKUM: 17.10.2025; Ogledov: 0; Prenosov: 6
Celotno besedilo (1,97 MB)

Opis: Magistrska naloga se osredotoča na določanje orientacije in hitrosti vesoljskega plovila na podlagi vizualnega zavedanja. Predstavljena je zasnova sistema kamer na satelitu, ki omogoča pridobitev podatkov iz okolja. Iz postavitve kamer je izpeljan matematični model za izračun in razlikovanje med orientacijo ter translacijo objekta. Posledično je izračunana zadnja rotacija in trenutna hitrost satelita. Delovanje algoritma je testirano v vesoljskem okolju v sklopu simulacije in na realnem sistemu v Zemeljskem okolju. Predstavljeni so rezultati meritev, podane so tudi izboljšave in možnosti nadaljnjega razvoja sistema.
Ključne besede: satelit, vizualno zavedanje, zaznava orientacije, zaznava hitrosti, signalno procesiranje
Objavljeno v DKUM: 22.09.2025; Ogledov: 0; Prenosov: 31
Celotno besedilo (24,65 MB)

Opis: The purpose of this article is to present the use of a previously validated wearable sensor device, Armbeep, in a real-life application, to enhance a tennis player’s training by monitoring and analysis of the time, physiological, movement, and tennis-specific workload and recovery indicators, based on fused sensor data acquired by the wearable sensor—a miniature wearable sensor device, designed to be worn on a wrist, that can detect and record movement and biometric information, where the basic signal processing is performed directly on the device, while the more complex signal analysis is performed in the cloud. The inertial measurements and pulse-rate detection of the wearable device were validated previously, showing acceptability for monitoring workload and recovery during tennis practice and matches. This study is one of the first attempts to monitor the daily workload and recovery of tennis players under real conditions. Based on these data, we can instruct the coach and the player to adjust the daily workload. This optimizes the level of an athlete’s training load, increases the effectiveness of training, enables an individual approach, and reduces the possibility of overuse or injuries. This study is a practical example of the use of modern technology in the return of injured athletes to normal training and competition. This information will help tennis coaches and players to objectify their workloads during training and competitions, as this is usually only an intuitive assessment.
Ključne besede: tennis, training, data-based coaching, shot recognition, wearable device, workload, recovery
Objavljeno v DKUM: 31.03.2025; Ogledov: 0; Prenosov: 12
Celotno besedilo (4,62 MB)
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Opis: V magistrskem delu je obravnavano načrtovanje in implementacija sistema za avtomatsko testiranje tiskanih vezij na prototipih pred serijsko proizvodnjo. V nalogi so predstavljene ključne tehnologije in standardi, ki so pomembni za razvoj sistema. Strežniški del sistema je bil razvit s programskim jezikom Python in uporabo ogrodja FastAPI in Uvicorn. Odjemalni del sistema je prav tako razvit s programskim jezikom Python, vendar z uporabo okolja JupyterLab. Podatki in poročila se shranjujejo v oddaljeno podatkovno bazo MySQL. Sistem omogoča hitrejše izvajanje enakih testov v enakih pogojih, saj poročilo in priložena datoteka vsebujeta vse potrebne informacije za ponovno izvedbo testiranja. Cilj razvoja sistema je razbremenitev testerja pisanja poročila in s tem pospešitev izvajanja testov, pri čemer pa ne trpi kvaliteta izvajanja testa.
Ključne besede: programsko inženirstvo, RESTful spletne storitve, avtomatizacija, testiranje, poročilo
Objavljeno v DKUM: 04.03.2025; Ogledov: 0; Prenosov: 51
Celotno besedilo (4,67 MB)

Opis: This article presents the results of dynamic measurements of 3-D multilevel cell (MLC) NAND flash memories in a mixed-field radiation facility CERN High-energy AcceleRator Mixed field/facility (CHARM), CERN. The results show that the behavior of devices is comparable to tests with specific high energy particles, such as high energy protons, heavy ions, and to TID tests. The observed TID and single-event effects (SEEs) in flash memories from the existing relevant work are also observed in mixed field, making the environment suitable for an accelerated system level test. As the CHARM hadron energy spectrum is comparable to the low Earth orbit (LEO) environment, the facility is appropriate as an accelerated test for space applications. Furthermore, the volumetric characteristics of the devices can be observed in this 3-D radiation facility. Additionally, bad bit (BB) spread was observed, and the necessary radiation induced errors in NAND devices are discussed.
Ključne besede: bit error rate, flkash memories, memory controller, mixed field facility, multilevel cell, MLC, radiation hardness, single-event upsets, SEUs, space applications, total ionizing dose
Objavljeno v DKUM: 03.02.2025; Ogledov: 0; Prenosov: 14
Celotno besedilo (9,44 MB)
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